Leica NA2 32X Automatic Level with Brunson 190 Optical Micrometer Kit
Leica NA2 32X Automatic Level with Brunson 190 Optical Micrometer Kit
    Leica NA2 32X Automatic Level with Brunson 190 Optical Micrometer Kit
Leica NA2 32X Automatic Level with Brunson 190 Optical Micrometer Kit

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Product Details

Leica's top-class optical quality gives the NA2 & NAK2 a bright high contrast image.

  • push button compensator check
  • endless horizontal drive for left and right handed users
  • coarse and fine focusing knob
  • play-free footscrews
  • optional eyepieces available
  • top-class optics

 

Accuracy (per 1km double run)
  • 0.7mm (dependent on operator/technique)
  • 0.3mm (with parallel-plate micrometer)
Magnification
  • Standard: 32x
  • with FOK73 eyepiece*: 40x
Shortest Focusing Distance
  • 1.6m
Compensator Setting Accuracy
  • 0.3"

 

*To improve accuracy a parallel plate micrometer can be fitted over the telescope objective. The parallel plate micrometer permits direct readings to 0.1mm and estimated readings to 0.01mm. This makes the NA2 and NAK2 an ideal precise level for deformation studies or industrial measuring tasks.

 

The NAK2 model has an internal glass circle for reading horizontal angles. Combined with the stadia calculation of distances from staff readings the NAK2 circle adds the application benefit of detail survey work.

 

 

PDF - Data Sheet PDF - Brochure
Data Sheet Brochure

 

 

Specifications
MPN 352038
Product Details

Leica's top-class optical quality gives the NA2 & NAK2 a bright high contrast image.

  • push button compensator check
  • endless horizontal drive for left and right handed users
  • coarse and fine focusing knob
  • play-free footscrews
  • optional eyepieces available
  • top-class optics

 

Accuracy (per 1km double run)
  • 0.7mm (dependent on operator/technique)
  • 0.3mm (with parallel-plate micrometer)
Magnification
  • Standard: 32x
  • with FOK73 eyepiece*: 40x
Shortest Focusing Distance
  • 1.6m
Compensator Setting Accuracy
  • 0.3"

 

*To improve accuracy a parallel plate micrometer can be fitted over the telescope objective. The parallel plate micrometer permits direct readings to 0.1mm and estimated readings to 0.01mm. This makes the NA2 and NAK2 an ideal precise level for deformation studies or industrial measuring tasks.

 

The NAK2 model has an internal glass circle for reading horizontal angles. Combined with the stadia calculation of distances from staff readings the NAK2 circle adds the application benefit of detail survey work.

 

 

PDF - Data Sheet PDF - Brochure
Data Sheet Brochure

 

 

Specifications
MPN 352038
Leica Geosystems Leica Geosystems

SKU:LE-352038

Leica NAK2 32X Automatic Level

Regular price
$6,850.00
Sale price
$6,850.00
Regular price
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Leica's top-class optical quality gives the NA2 & NAK2 a bright high contrast image.
Leica's top-class optical quality gives the NA2 & NAK2 a bright high contrast image.
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